سال انتشار: ۱۳۹۰

محل انتشار: بیست و ششمین کنفرانس بین المللی برق

تعداد صفحات: ۴

نویسنده(ها):

B Elmdost – Niroo Research Institute- Tehran- Iran
S Gharazil – Niroo Research Institute, Tehran, Iran
A Zamani – Taban Niroo Company, Shiraz, Iran

چکیده:

This work investigates on morphological and chemical characteristics of the surface of silicon insulators under aging conditions. For this purpose, a 500 hour salt-fog test was carried out on 24 KV insulators according to IEC 61109. FT-IR results showed that the intensity of Si-CH3 bond increased in the (SEM) was employed to monitor the morphological characteristics of the insulator after the test. SEM micrographs showed that the roughness of the sample increased under aging conditions. In order to investigate fillers’ concentration of the insulator before and after aging, Scanning Electron Al/Si of the virgin sample is higher than that of the aged one. It is due to deficiency of Al and Si fillers.