سال انتشار: ۱۳۹۱

محل انتشار: بیستمین کنفرانس مهندسی برق ایران

تعداد صفحات: ۴

نویسنده(ها):

Saeed Haji Nasiri – Department of Electrical Engineering, Qazvin Islamic Azad University
Rahim Faez – Department of Electrical Engineering, Sharif University of Technology
Bita Davoodi – Department of Electrical Engineering, Qazvin Islamic Azad University
Maryam Farrokhi –

چکیده:

Bode stability analysis based on transmission line modeling (TLM) for Graphene nanoribbon (GNR) interconnects used in 3D-VLSI circuits is investigated for the first time. In thisanalysis, the dependence of the degree of relative stability for multilayer GNR (MLGNR) interconnects on the geometry ofeach ribbon has been acquired. It is shown that, increasing the length and width of 3D structure, MLGNR interconnects become more stable